JCET provides customers with test development and test program migration services. Our capabilities include:
• Design for Manufacturing (DFM) consultation
• Test program development, debug and validation
• Device characterization
• First silicon characterization (wafer test)
• Test program optimization including test time optimization
• Probe card design, fabrication and qualification (wafer test)
• Load board design, fabrication and qualification (final test)
• Design, fabrication and qualification of any other interfacing hardware (final test)
• Multi-site migration to higher parallel testing
• Test program migration to a different test platform
Included with these services are any test program changes required to rapidly maximize and stabilize first pass yields for high volume production.
Test Development Flow
32028102000607
